{"id":409,"date":"2025-12-10T15:24:52","date_gmt":"2025-12-10T06:24:52","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/?post_type=service&#038;p=409"},"modified":"2026-02-23T10:54:03","modified_gmt":"2026-02-23T01:54:03","slug":"vitrox-v810is2ex","status":"publish","type":"service","link":"https:\/\/www.testsystem.co.jp\/en\/products\/vitrox-v810is2ex\/","title":{"rendered":"Advanced 3D Automatic X-Ray Inspection System ViTrox V810iS2EX"},"content":{"rendered":"\n<figure class=\"wp-block-image size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"830\" height=\"440\" src=\"https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_6_1.png\" alt=\"\" class=\"wp-image-597\" srcset=\"https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_6_1.png 830w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_6_1-300x159.png 300w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_6_1-768x407.png 768w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_6_1-790x420.png 790w\" sizes=\"auto, (max-width: 830px) 100vw, 830px\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Product Overview<\/strong><\/h2>\n\n\n\n<p>An in\u2011line compatible 3D automated X\u2011ray inspection system that enables high\u2011speed inspection of high\u2011density, double\u2011sided assembled PCBs.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Key Features<\/strong><\/h2>\n\n\n\n<h3 class=\"wp-block-heading\">Easy Programming<\/h3>\n\n\n\n<p>An intuitive user interface simplifies program creation, allowing inspection programs to be built quickly without specialized knowledge.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>Customizable Focus Areas<\/strong><\/h3>\n\n\n\n<p>Flexible focus\u2011area settings can be configured according to inspection targets, enabling support for diverse components and assembly configurations.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>Optimized Slice Settings<\/strong><\/h3>\n\n\n\n<p>Optimized slice settings reduce setup time and improve inspection accuracy, particularly for POP (Package on Package) components.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Auto-Learning Function<\/h3>\n\n\n\n<p>An auto\u2011learning feature significantly reduces program\u2011creation time, improving setup efficiency and overall productivity.<\/p>\n\n\n\n<div class=\"wp-block-buttons is-content-justification-center is-layout-flex wp-container-core-buttons-is-layout-16018d1d wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button\"><a class=\"wp-block-button__link has-white-color has-text-color has-background has-link-color wp-element-button\" href=\"https:\/\/www.testsystem.co.jp\/en\/tag\/inspection\/\" style=\"background-color:#123057\">Related product examples and technical information for X-ray inspection can be found here.<\/a><\/div>\n<\/div>\n","protected":false},"featured_media":597,"template":"","service_category":[17],"class_list":["post-409","service","type-service","status-publish","has-post-thumbnail","hentry","service_category-aoi_axi"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service\/409","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/service"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/597"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=409"}],"wp:term":[{"taxonomy":"service_category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service_category?post=409"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}