{"id":35,"date":"2025-11-18T11:38:05","date_gmt":"2025-11-18T02:38:05","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/service\/sample-service1\/"},"modified":"2026-03-11T14:48:35","modified_gmt":"2026-03-11T05:48:35","slug":"focus2000","status":"publish","type":"service","link":"https:\/\/www.testsystem.co.jp\/en\/products\/focus2000\/","title":{"rendered":"In-Circuit Tester Focus-2000"},"content":{"rendered":"\n
\"\"<\/figure>\n\n\n\n

Product Overview<\/strong><\/h2>\n\n\n\n

An test system that electrically measures the characteristics of components mounted on PCBs. High\u2011speed measurement is achieved through semiconductor switching, applying no stress to components under test. Its maintenance\u2011free design eliminates downtime.
* CE\u2011compliant models for European markets are also available.<\/p>\n\n\n\n

Key Features<\/strong><\/h2>\n\n\n\n

High\u2011Speed and Stable Measurement<\/h3>\n\n\n\n

Direct PC control of measurement circuits significantly reduces signal\u2011processing time, achieving high\u2011speed and stable measurement. This contributes to shorter test cycle times and improved measurement accuracy.<\/p>\n\n\n\n

Comprehensive Support Functions<\/h3>\n\n\n\n

Debug support, self\u2011diagnostic functions, and measurement data logging are provided as standard. These features support traceability and strongly assist with quality control and fault analysis.<\/p>\n\n\n\n

Efficient Test Result Management<\/h3>\n\n\n\n

Barcodes and QR codes enable reliable and efficient management of test results, simplifying product history tracking and reducing on\u2011site management workload.<\/p>\n\n\n\n

Product Specifications<\/strong><\/h2>\n\n\n\n

Basic Specifications<\/strong><\/h3>\n\n\n\n
Item<\/th>Standard<\/th><\/tr><\/thead>
OS<\/td>Windows 11 (64\u2011bit) Standard: English \/ Optional: Japanese<\/td><\/tr>
CPU<\/td>Intel Celeron G6900 Processor<\/td><\/tr>
Monitor<\/td>17\u2011inch TFT LCD<\/td><\/tr>
Printer<\/td>Thermal printer<\/td><\/tr>
External Interfaces<\/td>RS232C \u00d72 \/ 1Gbps Ethernet \/ USB \u00d78<\/td><\/tr>
Power Supply<\/td>AC100V\u2013240V \u00b110% (50\/60Hz), Power consumption: 120VA<\/td><\/tr>
Air Supply<\/td>0.4\u20130.6 MPa (dry clean air)<\/td><\/tr>
Operating Environment<\/td>Temperature: 10\u201330\u00b0C \/ Humidity: 30\u201380%<\/td><\/tr>
Dimensions & Weight<\/td>730mm \u00d7 800mm \u00d7 1540mm, 130Kg<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Measurement Section Specifications<\/strong><\/h3>\n\n\n\n
Item<\/th>Standard<\/th><\/tr><\/thead>
Test Points<\/td>Standard: 256 pins to a maximum of 2048 pins (expandable in 128\u2011pin increments)<\/td><\/tr>
Test Steps<\/td>Unlimited<\/td><\/tr>
Short Network Editing<\/td>\u2014<\/td><\/tr>
Guarding<\/td>Up to 5 points, max applied current: 20mA<\/td><\/tr>
Measurement Time<\/td>S\/O test: 1ms\/pin \/ Component test: 0.75ms<\/td><\/tr>
S\/O Test<\/td>Best\u2011product data upload method, thresholds: 5\/20\/80\u03a9<\/td><\/tr>
Resistance<\/td>0.1\u03a9\u201340.00M\u03a9 (4\u2011wire low\u2011resistance measurement optional)<\/td><\/tr>
Capacitor<\/td>10.0pF\u201340mF<\/td><\/tr>
Coil<\/td>10\u03bcH\u201340H<\/td><\/tr>
Diode<\/td>0.1V\u20139.9V<\/td><\/tr>
Digital Transistor<\/td>Operation test<\/td><\/tr>
Optocoupler<\/td>Operation test<\/td><\/tr>
Capacitor Polarity<\/td>PASS \/ FAIL<\/td><\/tr>
DC Voltage Applied Current Measurement<\/td>BIAS: 0\u201310V, 0\u201310mA<\/td><\/tr>
DC Current Applied Voltage Measurement<\/td>BIAS: 0\u201310V, 100nA \/ 1\u03bcA \/ 10\u03bcA \/ 100\u03bcA \/ 1mA \/ 10mA<\/td><\/tr>
DC Current Applied Voltage Measurement [D.CCV]<\/td>BIAS: 2\u03bcA\u201310000\u03bcA, Reading: 0.01\u20139.99V<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

Optional Functions<\/strong><\/h3>\n\n\n\n
Item<\/th>Support<\/th><\/tr><\/thead>
TestJET<\/td>\u2713<\/td><\/tr>
Various Functional Tests<\/td>\u2713<\/td><\/tr>
Flash ROM Programming<\/td>\u2713<\/td><\/tr>
Boundary Scan Test<\/td>\u2713<\/td><\/tr>
4\u2011Wire Low Resistance Measurement<\/td>\u2713<\/td><\/tr>
High Voltage Test<\/td>\u2713<\/td><\/tr>
2D Codes (QR, DMC, etc.)<\/td>\u2713<\/td><\/tr>
SQL Database Server Access<\/td>\u2713<\/td><\/tr>
Electric Press Unit<\/td>\u2713<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n
\n
Catalog PDF<\/strong><\/a><\/div>\n<\/div>\n\n\n\n

<\/p>\n\n\n\n

\n
Related product examples and technical information for Focus can be found here.<\/a><\/div>\n<\/div>\n","protected":false},"featured_media":566,"template":"","service_category":[4],"class_list":["post-35","service","type-service","status-publish","has-post-thumbnail","hentry","service_category-focus"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service\/35","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/service"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/566"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=35"}],"wp:term":[{"taxonomy":"service_category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service_category?post=35"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}