{"id":151,"date":"2025-11-29T00:50:10","date_gmt":"2025-11-28T15:50:10","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/?post_type=service&#038;p=151"},"modified":"2026-03-05T13:56:18","modified_gmt":"2026-03-05T04:56:18","slug":"foucs4000","status":"publish","type":"service","link":"https:\/\/www.testsystem.co.jp\/en\/products\/foucs4000\/","title":{"rendered":"Combination Tester Focus-4000"},"content":{"rendered":"\n<figure class=\"wp-block-image size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"830\" height=\"440\" src=\"https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_2_2.png\" alt=\"\" class=\"wp-image-567\" srcset=\"https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_2_2.png 830w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_2_2-300x159.png 300w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_2_2-768x407.png 768w, https:\/\/www.testsystem.co.jp\/en\/wp-content\/uploads\/2025\/12\/item_eye_2_2-790x420.png 790w\" sizes=\"auto, (max-width: 830px) 100vw, 830px\" \/><\/figure>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Product Overview<\/strong><\/h2>\n\n\n\n<p>The Combination Tester Focus\u20114000 is a single test system that performs both in\u2011circuit testing and functional testing in sequence. By integrating two test processes and fixtures into one unit, it improves work efficiency and reduces overall cost.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Key Features<\/strong><\/h2>\n\n\n\n<h3 class=\"wp-block-heading\">Simultaneous Testing Capability<\/h3>\n\n\n\n<p>In\u2011circuit testing and functional testing can be performed simultaneously. Integrating both test processes shortens test time and improves production efficiency.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>ROM Programming Support<\/strong><\/h3>\n\n\n\n<p>In addition to in\u2011circuit and functional testing, the system supports flash ROM programming (on\u2011board programming). Conducting test and programming in a single workflow reduces operator workload and ensures reliable quality assurance.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Main Specifications<\/strong><\/h2>\n\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><thead><tr><th><strong>Functional Specifications<\/strong><\/th><\/tr><\/thead><tbody><tr><td>Programmable Power Supply (high\u2011capacity \/ high\u2011precision, selectable)<\/td><\/tr><tr><td>Fixed Power Supply (5V \/ 12V \/ 24V)<\/td><\/tr><tr><td>Current Measurement: up to 2A<\/td><\/tr><tr><td>Voltage Measurement: up to 16 points (below \u00b160V)<\/td><\/tr><tr><td>Relay Unit: 16 points (max 1A)<\/td><\/tr><tr><td>Digital I\/O Unit: 24CH<\/td><\/tr><tr><td>Oscilloscope Unit: 2CH<\/td><\/tr><tr><td>Communication (Optional)<\/td><\/tr><tr><td>USB \/ RS232C \/ GPIB \/ CAN \/ LIN<\/td><\/tr><tr><td>ROM Programming (Optional)<\/td><\/tr><tr><td>Flash ROM programming (on\u2011board programming)<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<div class=\"wp-block-buttons is-content-justification-center is-layout-flex wp-container-core-buttons-is-layout-16018d1d wp-block-buttons-is-layout-flex\">\n<div class=\"wp-block-button\"><a class=\"wp-block-button__link has-white-color has-text-color has-background has-link-color wp-element-button\" href=\"https:\/\/www.testsystem.co.jp\/en\/tag\/focus\/\" style=\"background-color:#123057\">Related product examples and technical information for Focus can be found here.<\/a><\/div>\n<\/div>\n","protected":false},"featured_media":567,"template":"","service_category":[4],"class_list":["post-151","service","type-service","status-publish","has-post-thumbnail","hentry","service_category-focus"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service\/151","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/service"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/567"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=151"}],"wp:term":[{"taxonomy":"service_category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/service_category?post=151"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}