{"id":356,"date":"2025-12-10T12:08:16","date_gmt":"2025-12-10T03:08:16","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/?p=356"},"modified":"2026-03-05T13:34:48","modified_gmt":"2026-03-05T04:34:48","slug":"word2","status":"publish","type":"post","link":"https:\/\/www.testsystem.co.jp\/en\/word2\/","title":{"rendered":"Ionizer (Static Eliminator)"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\"><strong>Introduction<\/strong><\/h2>\n\n\n\n<p>Protection against component damage caused by electrostatic discharge (ESD) is an important consideration in PCB test. While using antistatic materials for fixture components that contact workpieces is essential, our equipment also offers built\u2011in ionizer (static eliminator) options for enhanced ESD protection.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Details<\/strong><\/h2>\n\n\n\n<p>Ionizers generate corona discharge at their electrodes to produce charged ions, which are directed toward the target object to neutralize its electrical charge. Integrating an ionizer into the equipment allows effective neutralization of static buildup on both workpieces and fixtures.<\/p>\n\n\n\n<p>Please note that the electrodes wear over time due to repeated corona discharge and require periodic replacement.<\/p>\n","protected":false},"excerpt":{"rendered":"Introduction Protection against component damage caused by electrostatic discharge (ESD) is an impor...","protected":false},"author":1,"featured_media":903,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[21],"tags":[102,100,98],"class_list":["post-356","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-techincs","tag-tag25","tag-tag20","tag-tag21"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/posts\/356","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/comments?post=356"}],"version-history":[{"count":0,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/posts\/356\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/903"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=356"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/categories?post=356"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/tags?post=356"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}