{"id":445,"date":"2026-01-01T15:01:32","date_gmt":"2026-01-01T06:01:32","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/?post_type=news&#038;p=445"},"modified":"2026-03-05T13:30:45","modified_gmt":"2026-03-05T04:30:45","slug":"260101","status":"publish","type":"news","link":"https:\/\/www.testsystem.co.jp\/en\/news\/260101\/","title":{"rendered":"Electrotest Japan 2026 Exhibition Announcement"},"content":{"rendered":"\n<p>We are pleased to announce our participation in the 40th Electrotest Japan, taking place from Wednesday, January 21 to Friday, January 23, 2026, at Tokyo Big Sight.<\/p>\n\n\n\n<p>At this exhibition, we will showcase newly developed products and features, including high\u2011precision automated PCB test lines integrated with AGVs, cost\u2011effective and high\u2011quality PCB test equipment, and a wide range of other products and solutions.<\/p>\n\n\n\n<p><strong>Main Exhibits:<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>In\u2011Circuit Tester compliant with European CE standards + NG Viewer<\/li>\n\n\n\n<li>Narrow\u2011pitch Hand Press + General\u2011Purpose Microcontroller FCT<\/li>\n\n\n\n<li>Newly developed high\u2011speed Flying Probe Tester for high\u2011density mounting and small\u2011lot production<\/li>\n\n\n\n<li>In\u2011Line ICT \/ FCT<\/li>\n\n\n\n<li>Fully automated test line with AGV\u2011based traceability<\/li>\n\n\n\n<li>Smart ICT \u2013 Data analysis and traceability software<\/li>\n\n\n\n<li>Easy\u2011visualization IoT system \u201cKap@sitas\u201d<\/li>\n<\/ul>\n\n\n\n<p>We look forward to welcoming you at our booth.<\/p>\n\n\n\n<p><strong>Event Details:<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Date:<\/strong> January 21 (Wed) &#8211; 23 (Fri), 2026<\/li>\n\n\n\n<li><strong>Time:<\/strong> 10:00 AM &#8211; 5:00 PM<\/li>\n\n\n\n<li><strong>Venue:<\/strong> Tokyo Big Sight, East Halls<\/li>\n\n\n\n<li><strong>Booth:<\/strong> East Hall 5, Booth No. E16-8 (Kyoritsu Test System Co., Ltd.)<\/li>\n<\/ul>\n\n\n\n<p>We sincerely look forward to your visit.<\/p>\n","protected":false},"featured_media":835,"template":"","news_category":[51],"class_list":["post-445","news","type-news","status-publish","has-post-thumbnail","hentry","news_category-event"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news\/445","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/news"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/835"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=445"}],"wp:term":[{"taxonomy":"news_category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news_category?post=445"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}