{"id":18,"date":"2025-02-01T11:38:04","date_gmt":"2025-02-01T02:38:04","guid":{"rendered":"https:\/\/www.testsystem.co.jp\/en\/news\/sample-news4\/"},"modified":"2026-02-23T10:21:14","modified_gmt":"2026-02-23T01:21:14","slug":"250201","status":"publish","type":"news","link":"https:\/\/www.testsystem.co.jp\/en\/news\/250201\/","title":{"rendered":"Notice of Discontinuation: Select Focus Series Products"},"content":{"rendered":"\n<p>Thank you for your continued support of our products.<br>Due to various business considerations, we regret to inform you that the following products will be discontinued.<br>We sincerely appreciate the many years of patronage from our customers and apologize for any inconvenience this may cause.<\/p>\n\n\n\n<p><strong>Discontinued Products:<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Compact In-Circuit Tester Focus-3000<\/li>\n\n\n\n<li>Digital Multimeter FX-300<\/li>\n\n\n\n<li>Multi-Function Tester FX-700<\/li>\n\n\n\n<li>Multi-Source Meter FX-710<\/li>\n<\/ul>\n\n\n\n<p><strong>End of Sales:<\/strong> June 30, 2025<\/p>\n\n\n\n<p><strong>Ongoing Support:<\/strong> Repair and calibration services will continue to be available after sales end.<br>However, for products manufactured more than 10 years ago, parts availability may limit our ability to provide service.<br>We kindly ask for your understanding.<\/p>\n","protected":false},"featured_media":834,"template":"","news_category":[6],"class_list":["post-18","news","type-news","status-publish","has-post-thumbnail","hentry","news_category-update"],"_links":{"self":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news\/18","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news"}],"about":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/types\/news"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media\/834"}],"wp:attachment":[{"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/media?parent=18"}],"wp:term":[{"taxonomy":"news_category","embeddable":true,"href":"https:\/\/www.testsystem.co.jp\/en\/wp-json\/wp\/v2\/news_category?post=18"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}