In-Circuit Tester Focus-2000
Product Overview
An test system that electrically measures the characteristics of components mounted on PCBs. High‑speed measurement is achieved through semiconductor switching, applying no stress to components under test. Its maintenance‑free design eliminates downtime.
* CE‑compliant models for European markets are also available.
Key Features
High‑Speed and Stable Measurement
Direct PC control of measurement circuits significantly reduces signal‑processing time, achieving high‑speed and stable measurement. This contributes to shorter test cycle times and improved measurement accuracy.
Comprehensive Support Functions
Debug support, self‑diagnostic functions, and measurement data logging are provided as standard. These features support traceability and strongly assist with quality control and fault analysis.
Efficient Test Result Management
Barcodes and QR codes enable reliable and efficient management of test results, simplifying product history tracking and reducing on‑site management workload.
Product Specifications
Basic Specifications
| Item | Standard |
|---|---|
| OS | Windows 11 (64‑bit) Standard: English / Optional: Japanese |
| CPU | Intel Celeron G6900 Processor |
| Monitor | 17‑inch TFT LCD |
| Printer | Thermal printer |
| External Interfaces | RS232C ×2 / 1Gbps Ethernet / USB ×8 |
| Power Supply | AC100V–240V ±10% (50/60Hz), Power consumption: 120VA |
| Air Supply | 0.4–0.6 MPa (dry clean air) |
| Operating Environment | Temperature: 10–30°C / Humidity: 30–80% |
| Dimensions & Weight | 730mm × 800mm × 1540mm, 130Kg |
Measurement Section Specifications
| Item | Standard |
|---|---|
| Test Points | Standard: 256 pins to a maximum of 2048 pins (expandable in 128‑pin increments) |
| Test Steps | Unlimited |
| Short Network Editing | — |
| Guarding | Up to 5 points, max applied current: 20mA |
| Measurement Time | S/O test: 1ms/pin / Component test: 0.75ms |
| S/O Test | Best‑product data upload method, thresholds: 5/20/80Ω |
| Resistance | 0.1Ω–40.00MΩ (4‑wire low‑resistance measurement optional) |
| Capacitor | 10.0pF–40mF |
| Coil | 10μH–40H |
| Diode | 0.1V–9.9V |
| Digital Transistor | Operation test |
| Optocoupler | Operation test |
| Capacitor Polarity | PASS / FAIL |
| DC Voltage Applied Current Measurement | BIAS: 0–10V, 0–10mA |
| DC Current Applied Voltage Measurement | BIAS: 0–10V, 100nA / 1μA / 10μA / 100μA / 1mA / 10mA |
| DC Current Applied Voltage Measurement [D.CCV] | BIAS: 2μA–10000μA, Reading: 0.01–9.99V |
Optional Functions
| Item | Support |
|---|---|
| TestJET | ✓ |
| Various Functional Tests | ✓ |
| Flash ROM Programming | ✓ |
| Boundary Scan Test | ✓ |
| 4‑Wire Low Resistance Measurement | ✓ |
| High Voltage Test | ✓ |
| 2D Codes (QR, DMC, etc.) | ✓ |
| SQL Database Server Access | ✓ |
| Electric Press Unit | ✓ |
